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TAKAYA Flying Probe Test Technology on Exhibit at Productronica 2019 :: I-Connect007

In Europe and the U.S., legislation is under way to revitalize PCB fabrication and packaging. What is the status of this work, and how specifically does this change the industry landscape for EMS companies? What will help keep us afloat?

The opportunity to use manufacturing simulation as a test bed for job planning and process optimization brings continuous improvement into the modern age. This may be an all-or-nothing type of project, but it’s worth the investment. 2 Pin Pogo Connector

TAKAYA Flying Probe Test Technology on Exhibit at Productronica 2019 :: I-Connect007

In this issue, we (and AI) explored how and when artificial intelligence plays a role in manufacturing today. Whether on the factory floor, or in the front office, AI applications are emerging and changing how we approach planning, processes and problem solving.

Estimated reading time: Less than a minute

TAKAYA’s flying probe test technology for testing single and double-sided PCBAs will be on display at Productronica 2019, November 12-15 in Munich, Germany. TAKAYA will be exhibiting in the Systech Europe booth in Hall A1, Stand 239. Systech Europe GmbH is a distribution and support group for TAKAYA, similar to TEXMAC USA, TAKAYA’s North American distributor.

The TAKAYA APT-1400F series flying probe test systems for assembled PCBAs can double the throughput of existing models, making it the industry’s fastest flying-probe test system.  Both the single- and dual-sided mobile probe systems can be optionally equipped with LED Color Sensors that enable the functional testing of LEDs. Color spectrum (RGB) and Luminance parameters of the LED can be verified to assure component specifications are met.

TAKAYA Flying Probe Test Technology on Exhibit at Productronica 2019 :: I-Connect007

Chip Probe Test TAKAYA’s APT-1600FD Advanced Flying Probe test system (shown) incorporates a new 10-flying-Z-axis design, including 4 vertical flying probes that provide unequalled access to test points where conventional angled probes cannot make contact. For more information, visit them at the show in Hall A1, Stand 239.